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Scanning Microscopy 2010
Postek, M.T.; Newbury, D.E.; Platek, S.F.; Joy, D.C. (2010). Scanning Microscopy 2010. Proceedings of SPIE, the International Society for Optical Engineering, 7729. SPIE: Washington. ISBN 9780819482174.
Part of: Proceedings of SPIE, the International Society for Optical Engineering. SPIE: Bellingham, WA. ISSN 0277-786X; e-ISSN 1996-756X, more
Peer reviewed article  
Authors  Top 
  • Postek, M.T.
  • Newbury, D.E.
  • Platek, S.F.
  • Joy, D.C.
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