Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level
Hoornaert, S.; Treiger, B.; Valkovic, V.; Van Grieken, R. (1998). Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level. Microchim. Acta 128: 207-213
In: Microchimica Acta. Springer Verlag: Wien; New York. ISSN 0026-3672; e-ISSN 1436-5073, meer
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